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Uncertainty Quantification for Integrated Circuits: Stochastic Spectral Methods

机译:集成电路的不确定性量化:随机谱   方法

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摘要

Due to significant manufacturing process variations, the performance ofintegrated circuits (ICs) has become increasingly uncertain. Such uncertaintiesmust be carefully quantified with efficient stochastic circuit simulators. Thispaper discusses the recent advances of stochastic spectral circuit simulatorsbased on generalized polynomial chaos (gPC). Such techniques can handle bothGaussian and non-Gaussian random parameters, showing remarkable speedup overMonte Carlo for circuits with a small or medium number of parameters. We focuson the recently developed stochastic testing and the application ofconventional stochastic Galerkin and stochastic collocation schemes tononlinear circuit problems. The uncertainty quantification algorithms forstatic, transient and periodic steady-state simulations are presented alongwith some practical simulation results. Some open problems in this field arediscussed.
机译:由于制造工艺的重大变化,集成电路(IC)的性能变得越来越不确定。必须使用有效的随机电路仿真器仔细量化这些不确定性。本文讨论了基于广义多项式混沌(gPC)的随机频谱电路仿真器的最新进展。这样的技术可以处理高斯和非高斯随机参数,对于参数数量少或中等的电路,显示出超过蒙特卡洛的加速性能。我们关注于最近开发的随机测试以及常规随机Galerkin和随机搭配方案在非线性电路问题中的应用。给出了用于静态,瞬态和周期性稳态仿真的不确定性量化算法,以及一些实际的仿真结果。讨论了该领域中一些未解决的问题。

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